DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chirumamilla, Manohar | - |
dc.contributor.author | Arya, Mahima | - |
dc.contributor.author | Ganguly, Ankita | - |
dc.contributor.author | Rout, Surya Snata | - |
dc.contributor.author | Krishnamurthy, Gnanavel Vaidhyanathan | - |
dc.contributor.author | Krekeler, Tobias | - |
dc.contributor.author | Ritter, Martin | - |
dc.contributor.author | Störmer, Michael | - |
dc.contributor.author | Petrov, Alexander | - |
dc.contributor.author | Eich, Manfred | - |
dc.date.accessioned | 2021-12-14T14:56:35Z | - |
dc.date.available | 2021-12-14T14:56:35Z | - |
dc.date.issued | 2021-05 | - |
dc.identifier.citation | Conference on Lasers and Electro-Optics (CLEO 2021) | de_DE |
dc.identifier.isbn | 978-194358091-0 | de_DE |
dc.identifier.uri | http://hdl.handle.net/11420/11291 | - |
dc.description.abstract | We measure and compare the optical properties of thin refractory metal films (TiN, W, Mo and Ir) at temperatures up to 1000 °C. In-situ ellipsometry is used to measure the optical constants. Refractory metals show long-term structural stability at 1000 °C for 120 h. | en |
dc.language.iso | en | de_DE |
dc.title | Optical Properties of the Refractory Metals at High Temperatures | de_DE |
dc.type | inProceedings | de_DE |
dc.type.dini | contributionToPeriodical | - |
dcterms.DCMIType | Text | - |
tuhh.abstract.english | We measure and compare the optical properties of thin refractory metal films (TiN, W, Mo and Ir) at temperatures up to 1000 °C. In-situ ellipsometry is used to measure the optical constants. Refractory metals show long-term structural stability at 1000 °C for 120 h. | de_DE |
tuhh.publication.institute | Optische und Elektronische Materialien E-12 | de_DE |
tuhh.publication.institute | Betriebseinheit Elektronenmikroskopie M-26 | de_DE |
tuhh.type.opus | InProceedings (Aufsatz / Paper einer Konferenz etc.) | - |
dc.type.driver | contributionToPeriodical | - |
dc.type.casrai | Conference Paper | - |
dc.relation.conference | Conference on Lasers and Electro-Optics, CLEO 2021 | de_DE |
dc.identifier.scopus | 2-s2.0-85120504772 | de_DE |
datacite.resourceType | Conference Paper | - |
datacite.resourceTypeGeneral | ConferencePaper | - |
item.openairetype | inProceedings | - |
item.creatorOrcid | Chirumamilla, Manohar | - |
item.creatorOrcid | Arya, Mahima | - |
item.creatorOrcid | Ganguly, Ankita | - |
item.creatorOrcid | Rout, Surya Snata | - |
item.creatorOrcid | Krishnamurthy, Gnanavel Vaidhyanathan | - |
item.creatorOrcid | Krekeler, Tobias | - |
item.creatorOrcid | Ritter, Martin | - |
item.creatorOrcid | Störmer, Michael | - |
item.creatorOrcid | Petrov, Alexander | - |
item.creatorOrcid | Eich, Manfred | - |
item.grantfulltext | none | - |
item.creatorGND | Chirumamilla, Manohar | - |
item.creatorGND | Arya, Mahima | - |
item.creatorGND | Ganguly, Ankita | - |
item.creatorGND | Rout, Surya Snata | - |
item.creatorGND | Krishnamurthy, Gnanavel Vaidhyanathan | - |
item.creatorGND | Krekeler, Tobias | - |
item.creatorGND | Ritter, Martin | - |
item.creatorGND | Störmer, Michael | - |
item.creatorGND | Petrov, Alexander | - |
item.creatorGND | Eich, Manfred | - |
item.languageiso639-1 | en | - |
item.fulltext | No Fulltext | - |
item.cerifentitytype | Publications | - |
item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
item.mappedtype | inProceedings | - |
crisitem.author.dept | Optische und Elektronische Materialien E-12 | - |
crisitem.author.dept | Optische und Elektronische Materialien E-12 | - |
crisitem.author.dept | Betriebseinheit Elektronenmikroskopie M-26 | - |
crisitem.author.dept | Betriebseinheit Elektronenmikroskopie M-26 | - |
crisitem.author.dept | Betriebseinheit Elektronenmikroskopie M-26 | - |
crisitem.author.dept | Optische und Elektronische Materialien E-12 | - |
crisitem.author.dept | Optische und Elektronische Materialien E-12 | - |
crisitem.author.orcid | 0000-0002-6812-286X | - |
crisitem.author.orcid | 0000-0003-0359-7693 | - |
crisitem.author.orcid | 0000-0002-4353-7858 | - |
crisitem.author.orcid | 0000-0002-5664-859X | - |
crisitem.author.orcid | 0000-0002-9031-9642 | - |
crisitem.author.orcid | 0000-0002-9213-9645 | - |
crisitem.author.orcid | 0000-0002-3096-5693 | - |
crisitem.author.parentorg | Studiendekanat Elektrotechnik, Informatik und Mathematik (E) | - |
crisitem.author.parentorg | Studiendekanat Elektrotechnik, Informatik und Mathematik (E) | - |
crisitem.author.parentorg | Studiendekanat Maschinenbau | - |
crisitem.author.parentorg | Studiendekanat Maschinenbau | - |
crisitem.author.parentorg | Studiendekanat Maschinenbau | - |
crisitem.author.parentorg | Studiendekanat Elektrotechnik, Informatik und Mathematik (E) | - |
crisitem.author.parentorg | Studiendekanat Elektrotechnik, Informatik und Mathematik (E) | - |
Appears in Collections: | Publications without fulltext |
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