DC FieldValueLanguage
dc.contributor.authorChirumamilla, Manohar-
dc.contributor.authorArya, Mahima-
dc.contributor.authorGanguly, Ankita-
dc.contributor.authorRout, Surya Snata-
dc.contributor.authorKrishnamurthy, Gnanavel Vaidhyanathan-
dc.contributor.authorKrekeler, Tobias-
dc.contributor.authorRitter, Martin-
dc.contributor.authorStörmer, Michael-
dc.contributor.authorPetrov, Alexander-
dc.contributor.authorEich, Manfred-
dc.date.accessioned2021-12-14T14:56:35Z-
dc.date.available2021-12-14T14:56:35Z-
dc.date.issued2021-05-
dc.identifier.citationConference on Lasers and Electro-Optics (CLEO 2021)de_DE
dc.identifier.isbn978-194358091-0de_DE
dc.identifier.urihttp://hdl.handle.net/11420/11291-
dc.description.abstractWe measure and compare the optical properties of thin refractory metal films (TiN, W, Mo and Ir) at temperatures up to 1000 °C. In-situ ellipsometry is used to measure the optical constants. Refractory metals show long-term structural stability at 1000 °C for 120 h.en
dc.language.isoende_DE
dc.titleOptical Properties of the Refractory Metals at High Temperaturesde_DE
dc.typeinProceedingsde_DE
dc.type.dinicontributionToPeriodical-
dcterms.DCMITypeText-
tuhh.abstract.englishWe measure and compare the optical properties of thin refractory metal films (TiN, W, Mo and Ir) at temperatures up to 1000 °C. In-situ ellipsometry is used to measure the optical constants. Refractory metals show long-term structural stability at 1000 °C for 120 h.de_DE
tuhh.publication.instituteOptische und Elektronische Materialien E-12de_DE
tuhh.publication.instituteBetriebseinheit Elektronenmikroskopie M-26de_DE
tuhh.type.opusInProceedings (Aufsatz / Paper einer Konferenz etc.)-
dc.type.drivercontributionToPeriodical-
dc.type.casraiConference Paper-
dc.relation.conferenceConference on Lasers and Electro-Optics, CLEO 2021de_DE
dc.identifier.scopus2-s2.0-85120504772de_DE
datacite.resourceTypeConference Paper-
datacite.resourceTypeGeneralConferencePaper-
item.openairetypeinProceedings-
item.creatorOrcidChirumamilla, Manohar-
item.creatorOrcidArya, Mahima-
item.creatorOrcidGanguly, Ankita-
item.creatorOrcidRout, Surya Snata-
item.creatorOrcidKrishnamurthy, Gnanavel Vaidhyanathan-
item.creatorOrcidKrekeler, Tobias-
item.creatorOrcidRitter, Martin-
item.creatorOrcidStörmer, Michael-
item.creatorOrcidPetrov, Alexander-
item.creatorOrcidEich, Manfred-
item.grantfulltextnone-
item.creatorGNDChirumamilla, Manohar-
item.creatorGNDArya, Mahima-
item.creatorGNDGanguly, Ankita-
item.creatorGNDRout, Surya Snata-
item.creatorGNDKrishnamurthy, Gnanavel Vaidhyanathan-
item.creatorGNDKrekeler, Tobias-
item.creatorGNDRitter, Martin-
item.creatorGNDStörmer, Michael-
item.creatorGNDPetrov, Alexander-
item.creatorGNDEich, Manfred-
item.languageiso639-1en-
item.fulltextNo Fulltext-
item.cerifentitytypePublications-
item.openairecristypehttp://purl.org/coar/resource_type/c_5794-
item.mappedtypeinProceedings-
crisitem.author.deptOptische und Elektronische Materialien E-12-
crisitem.author.deptOptische und Elektronische Materialien E-12-
crisitem.author.deptBetriebseinheit Elektronenmikroskopie M-26-
crisitem.author.deptBetriebseinheit Elektronenmikroskopie M-26-
crisitem.author.deptBetriebseinheit Elektronenmikroskopie M-26-
crisitem.author.deptOptische und Elektronische Materialien E-12-
crisitem.author.deptOptische und Elektronische Materialien E-12-
crisitem.author.orcid0000-0002-6812-286X-
crisitem.author.orcid0000-0003-0359-7693-
crisitem.author.orcid0000-0002-4353-7858-
crisitem.author.orcid0000-0002-5664-859X-
crisitem.author.orcid0000-0002-9031-9642-
crisitem.author.orcid0000-0002-9213-9645-
crisitem.author.orcid0000-0002-3096-5693-
crisitem.author.parentorgStudiendekanat Elektrotechnik, Informatik und Mathematik (E)-
crisitem.author.parentorgStudiendekanat Elektrotechnik, Informatik und Mathematik (E)-
crisitem.author.parentorgStudiendekanat Maschinenbau-
crisitem.author.parentorgStudiendekanat Maschinenbau-
crisitem.author.parentorgStudiendekanat Maschinenbau-
crisitem.author.parentorgStudiendekanat Elektrotechnik, Informatik und Mathematik (E)-
crisitem.author.parentorgStudiendekanat Elektrotechnik, Informatik und Mathematik (E)-
Appears in Collections:Publications without fulltext
Show simple item record

Page view(s)

43
Last Week
0
Last month
checked on Mar 30, 2023

Google ScholarTM

Check

Add Files to Item

Note about this record

Export

Items in TORE are protected by copyright, with all rights reserved, unless otherwise indicated.