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dc.contributor.authorChirumamilla, Manohar-
dc.contributor.authorArya, Mahima-
dc.contributor.authorGanguly, Ankita-
dc.contributor.authorRout, Surya Snata-
dc.contributor.authorKrishnamurthy, Gnanavel Vaidhyanathan-
dc.contributor.authorKrekeler, Tobias-
dc.contributor.authorRitter, Martin-
dc.contributor.authorStörmer, Michael-
dc.contributor.authorPetrov, Alexander-
dc.contributor.authorEich, Manfred-
dc.date.accessioned2021-12-14T14:56:35Z-
dc.date.available2021-12-14T14:56:35Z-
dc.date.issued2021-05-
dc.identifier.citationConference on Lasers and Electro-Optics (CLEO 2021)de_DE
dc.identifier.isbn978-194358091-0de_DE
dc.identifier.urihttp://hdl.handle.net/11420/11291-
dc.description.abstractWe measure and compare the optical properties of thin refractory metal films (TiN, W, Mo and Ir) at temperatures up to 1000 °C. In-situ ellipsometry is used to measure the optical constants. Refractory metals show long-term structural stability at 1000 °C for 120 h.en
dc.language.isoende_DE
dc.titleOptical Properties of the Refractory Metals at High Temperaturesde_DE
dc.typeinProceedingsde_DE
dc.type.dinicontributionToPeriodical-
dcterms.DCMITypeText-
tuhh.abstract.englishWe measure and compare the optical properties of thin refractory metal films (TiN, W, Mo and Ir) at temperatures up to 1000 °C. In-situ ellipsometry is used to measure the optical constants. Refractory metals show long-term structural stability at 1000 °C for 120 h.de_DE
tuhh.publication.instituteOptische und Elektronische Materialien E-12de_DE
tuhh.publication.instituteBetriebseinheit Elektronenmikroskopie M-26de_DE
tuhh.type.opusInProceedings (Aufsatz / Paper einer Konferenz etc.)-
dc.type.drivercontributionToPeriodical-
dc.type.casraiConference Paper-
dc.relation.conferenceConference on Lasers and Electro-Optics, CLEO 2021de_DE
dc.identifier.scopus2-s2.0-85120504772de_DE
datacite.resourceTypeConference Paper-
datacite.resourceTypeGeneralConferencePaper-
item.openairetypeinProceedings-
item.creatorOrcidChirumamilla, Manohar-
item.creatorOrcidArya, Mahima-
item.creatorOrcidGanguly, Ankita-
item.creatorOrcidRout, Surya Snata-
item.creatorOrcidKrishnamurthy, Gnanavel Vaidhyanathan-
item.creatorOrcidKrekeler, Tobias-
item.creatorOrcidRitter, Martin-
item.creatorOrcidStörmer, Michael-
item.creatorOrcidPetrov, Alexander-
item.creatorOrcidEich, Manfred-
item.grantfulltextnone-
item.creatorGNDChirumamilla, Manohar-
item.creatorGNDArya, Mahima-
item.creatorGNDGanguly, Ankita-
item.creatorGNDRout, Surya Snata-
item.creatorGNDKrishnamurthy, Gnanavel Vaidhyanathan-
item.creatorGNDKrekeler, Tobias-
item.creatorGNDRitter, Martin-
item.creatorGNDStörmer, Michael-
item.creatorGNDPetrov, Alexander-
item.creatorGNDEich, Manfred-
item.languageiso639-1en-
item.fulltextNo Fulltext-
item.cerifentitytypePublications-
item.openairecristypehttp://purl.org/coar/resource_type/c_5794-
item.mappedtypeinProceedings-
crisitem.author.deptOptische und Elektronische Materialien E-12-
crisitem.author.deptOptische und Elektronische Materialien E-12-
crisitem.author.deptBetriebseinheit Elektronenmikroskopie M-26-
crisitem.author.deptBetriebseinheit Elektronenmikroskopie M-26-
crisitem.author.deptBetriebseinheit Elektronenmikroskopie M-26-
crisitem.author.deptOptische und Elektronische Materialien E-12-
crisitem.author.deptOptische und Elektronische Materialien E-12-
crisitem.author.orcid0000-0002-6812-286X-
crisitem.author.orcid0000-0003-0359-7693-
crisitem.author.orcid0000-0002-4353-7858-
crisitem.author.orcid0000-0002-5664-859X-
crisitem.author.orcid0000-0002-9031-9642-
crisitem.author.orcid0000-0002-9213-9645-
crisitem.author.orcid0000-0002-3096-5693-
crisitem.author.parentorgStudiendekanat Elektrotechnik, Informatik und Mathematik (E)-
crisitem.author.parentorgStudiendekanat Elektrotechnik, Informatik und Mathematik (E)-
crisitem.author.parentorgStudiendekanat Maschinenbau-
crisitem.author.parentorgStudiendekanat Maschinenbau-
crisitem.author.parentorgStudiendekanat Maschinenbau-
crisitem.author.parentorgStudiendekanat Elektrotechnik, Informatik und Mathematik (E)-
crisitem.author.parentorgStudiendekanat Elektrotechnik, Informatik und Mathematik (E)-
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