Please use this identifier to cite or link to this item: https://doi.org/10.15480/882.1158
Fulltext available Open Access
Publisher version: Journal fo the mechanics and physics of solids ; 63.2014, Feb., pp. 201-213
metadata.tuhh.publisher.uri: http://dx.doi.org/10.1016/j.jmps.2013.09.009
Title: Size-dependence of the dielectric breakdown strength from nano- to millimeter scale
Language: English
Authors: Neusel, Claudia 
Schneider, Gerold A. 
Keywords: Dickenabhängigkeit;Permittivität;Breakdown strength;ceramics;polymers;thickness-dependence;permittivity-dependence
Issue Date: 2013
Source: Journal of the Mechanics and Physics of Solids ; 63.2014, Feb., S. 201 – 213
Abstract (english): Dielectric breakdown decisively determines the reliability of nano- to centimeter sized electronic devices and components. Nevertheless, a systematic investigation of this phenomenon over the relevant lengths scales and materials classes is still missing. Here, the thickness and permittivity-dependence of the dielectric breakdown strength of insulating crystalline and polymer materials from the millimeter down to the nanometer scale is investigated. While the dependence of breakdown strength on permittivity was found to be thickness-independent for materials in the nm-mm range, the magnitude of the breakdown strength was found to change from a thickness-independent, intrinsic regime, to a thickness-dependent, extrinsic regime. The transition-thickness is interpreted as the characteristic length of a breakdown-initiating conducting filament. The results are in agreement with a model, where the dielectric breakdown strength is defined in terms of breakdown toughness and length of a conducting filament.
URI: http://tubdok.tub.tuhh.de/handle/11420/1160
DOI: 10.15480/882.1158
Institute: Keramische Hochleistungswerkstoffe M-9 
Type: ResearchPaper
License: http://doku.b.tu-harburg.de/doku/lic_mit_pod.php
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