Please use this identifier to cite or link to this item: https://doi.org/10.15480/882.1620
Fulltext available Open Access
Publisher DOI: 10.1038/ncomms11809
Title: Controlling thermal emission with refractory epsilon-near-zero metamaterials via topological transitions
Language: English
Authors: Dyachenko, Pavel N. 
Molesky, Sean 
Petrov, Alexander  
Störmer, Michael 
Krekeler, Tobias 
Lang, Slawa 
Ritter, Martin  
Jacob, Zubin 
Eich, Manfred 
Issue Date: 6-Jun-2016
Publisher: Nature Publishing Group UK
Source: Nature communications 7: 11809 (2016)
Journal or Series Name: Nature communications 
Abstract (english): Control of thermal radiation at high temperatures is vital for waste heat recovery and for high-efficiency thermophotovoltaic (TPV) conversion. Previously, structural resonances utilizing gratings, thin film resonances, metasurfaces and photonic crystals were used to spectrally control thermal emission, often requiring lithographic structuring of the surface and causing significant angle dependence. In contrast, here, we demonstrate a refractory W-HfO2 metamaterial, which controls thermal emission through an engineered dielectric response function. The epsilon-near-zero frequency of a metamaterial and the connected optical topological transition (OTT) are adjusted to selectively enhance and suppress the thermal emission in the near-infrared spectrum, crucial for improved TPV efficiency. The near-omnidirectional and spectrally selective emitter is obtained as the emission changes due to material properties and not due to resonances or interference effects, marking a paradigm shift in thermal engineering approaches. We experimentally demonstrate the OTT in a thermally stable metamaterial at high temperatures of 1,000 °C.
URI: http://tubdok.tub.tuhh.de/handle/11420/1623
DOI: 10.15480/882.1620
ISSN: 2041-1723
Institute: Optische und Elektronische Materialien E-12 
Type: (wissenschaftlicher) Artikel
Project: SFB 986, Teilproject C1 - Strukturierte Emitter für effiziente und effektive Thermophotovoltaik 
SFB 986: Zentralprojekt Z3 - Elektronenmikroskopie an multiskaligen Materialsystemen 
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