Please use this identifier to cite or link to this item: https://doi.org/10.15480/882.1650
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DC FieldValueLanguage
dc.contributor.authorKrekeler, Tobias-
dc.contributor.authorStraßer, Anastasia V.-
dc.contributor.authorGraf, Matthias-
dc.contributor.authorWang, Ke-
dc.contributor.authorHartig, Christian-
dc.contributor.authorRitter, Martin-
dc.contributor.authorWeissmüller, Jörg-
dc.date.accessioned2018-05-25T04:30:46Z-
dc.date.available2018-05-25T04:30:46Z-
dc.date.issued2017-01-17-
dc.identifier.citationMaterials Research Letters 5 (5): 314-321 (2017)de_DE
dc.identifier.issn2166-3831de_DE
dc.identifier.urihttp://tubdok.tub.tuhh.de/handle/11420/1653-
dc.description.abstractHerein we report on how to render Ti3C2Tx (MXene) monolayers deposited on SiO2/Si wafers, with different SiO2 thicknesses, visible. Inputting the effective thickness of a Ti3C2Tx monolayer (1 ± 0.2 nm) measured by atomic force microscopy, and its refractive index into a Fresnel-law-based simulation software, we show that the optical contrast of Ti3C2Tx monolayers deposited on SiO2/Si wafers depends on the SiO2 thickness, number of MXene layers, and the light’s wavelength. The highest contrast was found for SiO2 thicknesses around 220 nm. Simulations for other substrates, namely, Al2O3/Si, HfO2/Si, Si3N4/Si and Al2O3/Al, are presented as supplementary information.en
dc.language.isoende_DE
dc.publisherTaylor & Francisde_DE
dc.relation.ispartofMaterials Research Lettersde_DE
dc.rightsinfo:eu-repo/semantics/openAccessde_DE
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/
dc.subjectdealloyingde_DE
dc.subjectnanoporous goldde_DE
dc.subjectelemental mappingde_DE
dc.subjectelectron microscopyde_DE
dc.subjectkinetic Monte Carlo simulationde_DE
dc.subject.ddc620: Ingenieurwissenschaftende_DE
dc.titleSilver-rich clusters in nanoporous goldde_DE
dc.typeArticlede_DE
dc.identifier.urnurn:nbn:de:gbv:830-88220825-
dc.identifier.doi10.15480/882.1650-
dc.type.diniarticle-
dc.subject.ddccode620-
dcterms.DCMITypeText-
tuhh.identifier.urnurn:nbn:de:gbv:830-88220825de_DE
tuhh.oai.showtruede_DE
dc.identifier.hdl11420/1653-
tuhh.abstract.englishHerein we report on how to render Ti3C2Tx (MXene) monolayers deposited on SiO2/Si wafers, with different SiO2 thicknesses, visible. Inputting the effective thickness of a Ti3C2Tx monolayer (1 ± 0.2 nm) measured by atomic force microscopy, and its refractive index into a Fresnel-law-based simulation software, we show that the optical contrast of Ti3C2Tx monolayers deposited on SiO2/Si wafers depends on the SiO2 thickness, number of MXene layers, and the light’s wavelength. The highest contrast was found for SiO2 thicknesses around 220 nm. Simulations for other substrates, namely, Al2O3/Si, HfO2/Si, Si3N4/Si and Al2O3/Al, are presented as supplementary information.de_DE
tuhh.publisher.doi10.1080/21663831.2016.1276485-
tuhh.publication.instituteWerkstoffphysik und -technologie M-22de_DE
tuhh.publication.instituteBetriebseinheit Elektronenmikroskopie M-26de_DE
tuhh.identifier.doi10.15480/882.1650-
tuhh.type.opus(wissenschaftlicher) Artikel-
tuhh.institute.germanBetriebseinheit Elektronenmikroskopie M-26de
tuhh.institute.englishBetriebseinheit Elektronenmikroskopie M-26de_DE
tuhh.gvk.hasppnfalse-
tuhh.hasurnfalse-
openaire.rightsinfo:eu-repo/semantics/openAccessde_DE
dc.type.driverarticle-
dc.rights.ccversion4.0de_DE
dc.type.casraiJournal Article-
tuhh.container.issue5de_DE
tuhh.container.volume5de_DE
tuhh.container.startpage314de_DE
tuhh.container.endpage321de_DE
dc.relation.projectSFB 986: Teilprojekt B2 - Feste und leichte Hybridwerkstoffe auf Basis nanoporöser Metallede_DE
dc.relation.projectSFB 986: Zentralprojekt Z3 - Elektronenmikroskopie an multiskaligen Materialsystemen-
dc.rights.nationallicensefalsede_DE
item.creatorGNDKrekeler, Tobias-
item.creatorGNDStraßer, Anastasia V.-
item.creatorGNDGraf, Matthias-
item.creatorGNDWang, Ke-
item.creatorGNDHartig, Christian-
item.creatorGNDRitter, Martin-
item.creatorGNDWeissmüller, Jörg-
item.languageiso639-1en-
item.fulltextWith Fulltext-
item.cerifentitytypePublications-
item.openairetypeArticle-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.grantfulltextopen-
item.creatorOrcidKrekeler, Tobias-
item.creatorOrcidStraßer, Anastasia V.-
item.creatorOrcidGraf, Matthias-
item.creatorOrcidWang, Ke-
item.creatorOrcidHartig, Christian-
item.creatorOrcidRitter, Martin-
item.creatorOrcidWeissmüller, Jörg-
crisitem.author.deptBetriebseinheit Elektronenmikroskopie M-26-
crisitem.author.deptWerkstoffphysik und -technologie M-22-
crisitem.author.deptWerkstoffphysik und -technologie M-22-
crisitem.author.deptWerkstoffphysik und -technologie M-22-
crisitem.author.deptWerkstoffphysik und -technologie M-22-
crisitem.author.deptBetriebseinheit Elektronenmikroskopie M-26-
crisitem.author.deptWerkstoffphysik und -technologie M-22-
crisitem.author.orcid0000-0002-2065-0014-
crisitem.author.orcid0000-0002-1174-0907-
crisitem.author.orcid0000-0002-5664-859X-
crisitem.author.orcid0000-0002-8958-4414-
crisitem.author.parentorgStudiendekanat Maschinenbau-
crisitem.author.parentorgStudiendekanat Maschinenbau-
crisitem.author.parentorgStudiendekanat Maschinenbau-
crisitem.author.parentorgStudiendekanat Maschinenbau-
crisitem.author.parentorgStudiendekanat Maschinenbau-
crisitem.author.parentorgStudiendekanat Maschinenbau-
crisitem.author.parentorgStudiendekanat Maschinenbau-
crisitem.project.funderDeutsche Forschungsgemeinschaft (DFG)-
crisitem.project.funderDeutsche Forschungsgemeinschaft (DFG)-
crisitem.project.funderid501100001659-
crisitem.project.funderid501100001659-
crisitem.project.funderrorid018mejw64-
crisitem.project.funderrorid018mejw64-
crisitem.project.grantno192346071-
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