Please use this identifier to cite or link to this item: https://doi.org/10.15480/882.1877
This item is licensed with a CreativeCommons licence by/3.0
Publisher DOI: 10.1088/0960-1317/26/3/035010
Title: Enhanced DySEM imaging of cantilever motion using artificial structures patterned by focused ion beam techniques
Language: English
Authors: Schröter, Maria-Astrid 
Ritter, Martin 
Holschneider, Matthias 
Sturm, Heinz 
Keywords: FIB patterning;structured cantilever;AFM;modal analysis;DySEM
Issue Date: 4-Feb-2016
Publisher: IOP
Source: Journal of Micromechanics and Microengineering 3 (26): 035010- (2016-02-04)
Journal or Series Name: Journal of micromechanics and microengineering 
Abstract (english): We use a dynamic scanning electron microscope (DySEM) to map the spatial distribution of the vibration of a cantilever beam. The DySEM measurements are based on variations of the local secondary electron signal within the imaging electron beam diameter during an oscillation period of the cantilever. For this reason, the surface of a cantilever without topography or material variation does not allow any conclusions about the spatial distribution of vibration due to a lack of dynamic contrast. In order to overcome this limitation, artificial structures were added at defined positions on the cantilever surface using focused ion beam lithography patterning. The DySEM signal of such high-contrast structures is strongly improved, hence information about the surface vibration becomes accessible. Simulations of images of the vibrating cantilever have also been performed. The results of the simulation are in good agreement with the experimental images.
URI: http://tubdok.tub.tuhh.de/handle/11420/1880
DOI: 10.15480/882.1877
ISSN: 1361-6439
Institute: Betriebseinheit Elektronenmikroskopie M-26 
Type: (wissenschaftlicher) Artikel
Appears in Collections:Publications (tub.dok)

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