Please use this identifier to cite or link to this item: https://doi.org/10.15480/882.267
Title: Analyzing the quality of carbon nanotube dispersions in polymers using scanning electron microscopy
Language: English
Authors: Lott, Josef-Zoltan 
Andresen, Kjer 
Pauls, Jan Roman 
Pardo Garcia, Claudia 
Schossig, Michael 
Schulte, Karl 
Bauhofer, Wolfgang 
Keywords: Carbon Nanotubes;Resins;Scanning Electron Microscopy;Electrical Properties
Issue Date: 2007
Source: Carbon (2007), doi:10.1016/j.carbon.2007.01.012
Abstract (english): The ability to examine conducting filler particles in an insulating polymer matrix by scanning electron microscopy (SEM) was investigated. The detection of selected secondary electrons is necessary to resolve sub-micron scale filler particles, but not every SEM detector seems to be able to monitor the small changes introduced by the conducting filler particles. The influence of SEM parameters and the challenge of image interpretation in view of the apparent lack of appropriate information in literature are discussed. In accordance with other experiments on light element samples, all monitored electrons seem to be emitted within approximately 50 nm of the sample depth and no information is accessible from deeper regions even by increasing the acceleration voltage.
URI: http://tubdok.tub.tuhh.de/handle/11420/269
DOI: 10.15480/882.267
Institute: Optische und Elektronische Materialien E-12 
Kunststoffe und Verbundwerkstoffe M-11 
Type: Preprint (Vorabdruck)
Appears in Collections:Publications (tub.dok)

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