Please use this identifier to cite or link to this item: https://doi.org/10.15480/882.2400
Publisher DOI: 10.3390/nano9091230
Title: Elasticity of cross-linked titania nanocrystal assemblies probed by AFM-bulge tests
Language: English
Authors: Hensel, Andreas 
Schröter, Clemens Jasper 
Schlicke, Hendrik 
Schulz, Norbert 
Riekeberg, Svenja 
Trieu, Hoc Khiem 
Stierle, Andreas 
Noei, Heshmat 
Weller, Horst 
Vossmeyer, Tobias 
Keywords: composite film;bulge test;AFM;titania;nanoparticle;layer-by-layer;attenuation coefficient;elastic modulus;Young’s modulus;XPS
Issue Date: 29-Aug-2019
Publisher: Multidisciplinary Digital Publishing Institute
Source: Nanomaterials 9 (9): 1230 (2019)
Journal or Series Name: Nanomaterials 
Abstract (english): In order to enable advanced technological applications of nanocrystal composites, e.g., as functional coatings and layers in flexible optics and electronics, it is necessary to understand and control their mechanical properties. The objective of this study was to show how the elasticity of such composites depends on the nanocrystals’ dimensionality. To this end, thin films of titania nanodots (TNDs; diameter: ~3–7 nm), nanorods (TNRs; diameter: ~3.4 nm; length: ~29 nm), and nanoplates (TNPs; thickness: ~6 nm; edge length: ~34 nm) were assembled via layer-by-layer spin-coating. 1,12-dodecanedioic acid (12DAC) was added to cross-link the nanocrystals and to enable regular film deposition. The optical attenuation coefficients of the films were determined by ultraviolet/visible (UV/vis) absorbance measurements, revealing much lower values than those known for titania films prepared via chemical vapor deposition (CVD). Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) images showed a homogeneous coverage of the substrates on the µm-scale but a highly disordered arrangement of nanocrystals on the nm-scale. X-ray photoelectron spectroscopy (XPS) analyses confirmed the presence of the 12DAC cross-linker after film fabrication. After transferring the films onto silicon substrates featuring circular apertures (diameter: 32–111 µm), freestanding membranes (thickness: 20–42 nm) were obtained and subjected to atomic force microscopy bulge tests (AFM-bulge tests). These measurements revealed increasing elastic moduli with increasing dimensionality of the nanocrystals, i.e., 2.57 ± 0.18 GPa for the TND films, 5.22 ± 0.39 GPa for the TNR films, and 7.21 ± 1.04 GPa for the TNP films.
URI: http://hdl.handle.net/11420/3340
DOI: 10.15480/882.2400
ISSN: 2079-4991
Other Identifiers: doi: 10.3390/nano9091230
Institute: Mikrosystemtechnik E-7 
Type: (wissenschaftlicher) Artikel
Funded by: Deutsche Forschungsgemeinschaft (DFG)
Project: 192346071 
SFB 986, project A1 
SFB 986, project A7 
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