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  4. Elasticity of cross-linked titania nanocrystal assemblies probed by AFM-bulge tests
 
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Elasticity of cross-linked titania nanocrystal assemblies probed by AFM-bulge tests

Citation Link: https://doi.org/10.15480/882.2400
Publikationstyp
Journal Article
Date Issued
2019-08-29
Sprache
English
Author(s)
Hensel, Andreas  
Schröter, Clemens Jasper  
Schlicke, Hendrik  
Schulz, Norbert  
Riekeberg, Svenja  
Trieu, Hoc Khiem  
Stierle, Andreas  
Noei, Heshmat  
Weller, Horst  
Vossmeyer, Tobias  
Institut
Mikrosystemtechnik E-7  
TORE-DOI
10.15480/882.2400
TORE-URI
http://hdl.handle.net/11420/3340
Journal
Nanomaterials  
Volume
9
Issue
9
Article Number
1230
Citation
Nanomaterials 9 (9): 1230 (2019)
Publisher DOI
10.3390/nano9091230
Scopus ID
2-s2.0-85073479117
Publisher
Multidisciplinary Digital Publishing Institute
In order to enable advanced technological applications of nanocrystal composites, e.g., as functional coatings and layers in flexible optics and electronics, it is necessary to understand and control their mechanical properties. The objective of this study was to show how the elasticity of such composites depends on the nanocrystals’ dimensionality. To this end, thin films of titania nanodots (TNDs; diameter: ~3–7 nm), nanorods (TNRs; diameter: ~3.4 nm; length: ~29 nm), and nanoplates (TNPs; thickness: ~6 nm; edge length: ~34 nm) were assembled via layer-by-layer spin-coating. 1,12-dodecanedioic acid (12DAC) was added to cross-link the nanocrystals and to enable regular film deposition. The optical attenuation coefficients of the films were determined by ultraviolet/visible (UV/vis) absorbance measurements, revealing much lower values than those known for titania films prepared via chemical vapor deposition (CVD). Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) images showed a homogeneous coverage of the substrates on the µm-scale but a highly disordered arrangement of nanocrystals on the nm-scale. X-ray photoelectron spectroscopy (XPS) analyses confirmed the presence of the 12DAC cross-linker after film fabrication. After transferring the films onto silicon substrates featuring circular apertures (diameter: 32–111 µm), freestanding membranes (thickness: 20–42 nm) were obtained and subjected to atomic force microscopy bulge tests (AFM-bulge tests). These measurements revealed increasing elastic moduli with increasing dimensionality of the nanocrystals, i.e., 2.57 ± 0.18 GPa for the TND films, 5.22 ± 0.39 GPa for the TNR films, and 7.21 ± 1.04 GPa for the TNP films.
Subjects
composite film
bulge test
AFM
titania
nanoparticle
layer-by-layer
attenuation coefficient
elastic modulus
Young’s modulus
XPS
DDC Class
530: Physik
540: Chemie
600: Technik
620: Ingenieurwissenschaften
Funding(s)
SFB 986: Teilprojekt Z2  
More Funding Information
Deutsche Forschungsgemeinschaft (DFG)
Lizenz
https://creativecommons.org/licenses/by/4.0/
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