Publisher DOI: 10.23919/EuMC.2018.8541437
Title: An Accurate Free Space Method for Material Characterization in W- Band Using Material Samples with Two Different Thicknesses
Language: English
Authors: Lau, Isabella 
Frank, Martin 
Shi, Kilin 
Lurz, Fabian 
Talai, Armin 
Weigel, Robert 
Kölpin, Alexander  
Keywords: dielectric materials;materials nondestructive testing;microwave measurement;permittivity
Issue Date: 20-Nov-2018
Source: European Microwave Conference, EuMC: 8541437 (2018-11-20)
Abstract (english): This paper presents an accurate free space method for material characterization eliminating the problem of the required precise orientation between the material and the antennas and expanding the unambiguous range for electrical thick samples. It includes theoretical considerations and measurement results of four different materials. Overall, a maximum measurement uncertainty of 0.0153 for the relative permittivity and 0.001 for the loss tangent in the W-band can be achieved. Depending on the variation of the material's thickness, the implemented setup changes lead to an reduction of the measurement uncertainty of 8 to 58 %.
Conference: 48th European Microwave Conference, EuMC 2018 
URI: http://hdl.handle.net/11420/6514
ISBN: 978-287487051-4
Type: InProceedings (Aufsatz / Paper einer Konferenz etc.)
Appears in Collections:Publications without fulltext

Show full item record

Page view(s)

9
checked on Jul 6, 2020

Google ScholarTM

Check

Add Files to Item

Note about this record

Export

Items in TORE are protected by copyright, with all rights reserved, unless otherwise indicated.