| Title: | Emulation of Neural Networks under HW Faults | Language: | English | Authors: | Bahnsen, Fin Hendrik Klebe, Vanessa Fey, Görschwin  |
Issue Date: | 2020 | Source: | GI/GMM/ITG-Workshop für Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TUZ 2020) | Conference: | GI/GMM/ITG-Workshop für Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TUZ 2020) | URI: | http://hdl.handle.net/11420/8423 | Institute: | Eingebettete Systeme E-13 | Document Type: | Chapter/Article (Proceedings) |
| Appears in Collections: | Publications without fulltext |
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