Title: Emulation of Neural Networks under HW Faults
Language: English
Authors: Bahnsen, Fin Hendrik 
Klebe, Vanessa 
Fey, Görschwin  
Issue Date: 2020
Source: GI/GMM/ITG-Workshop für Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TUZ 2020)
Conference: GI/GMM/ITG-Workshop für Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TUZ 2020) 
URI: http://hdl.handle.net/11420/8423
Institute: Eingebettete Systeme E-13 
Document Type: Chapter/Article (Proceedings)
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