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Publisher DOI: 10.1109/TNS.2021.3061197
Title: Radiation hardness assurance through system-level testing: risk acceptance, facility requirements, test methodology, and data exploitation
Language: English
Authors: Coronetti, Andrea 
Alía, Rubén Garcia 
Budroweit, Jan 
Rajkowski, Tomasz 
Da Costa Lopes, Israel 
Niskanen, Kimmo 
Söderström, Daniel 
Cazzaniga, Carlo 
Ferraro, Rudy 
Danzeca, Salvatore 
Mekki, Julien 
Manni, Florent 
Dangla, David 
Virmontois, Cedric 
Kerboub, Nourdine 
Kölpin, Alexander  
Saigne, Frederic 
Wang, Pierre 
Pouget, Vincent 
Touboul, Antoine 
Javanainen, Arto 
Kettunen, Heikki 
Germanicus, Rosine 
Keywords: Commercial off-the-shelf (COTS);facilities;neutrons;protons;radiation hardness assurance;risk acceptance;single-event effect (SEE);small satellites;system-level testing;test methodology;total ionizing dose (TID)
Issue Date: 22-Feb-2021
Publisher: IEEE
Source: IEEE Transactions on Nuclear Science 68 (5): 9360625, 958-969 (2021-05-01)
Journal: IEEE transactions on nuclear science 
Abstract (english): 
Functional verification schemes at a level different from component-level testing are emerging as a cost-effective tool for those space systems for which the risk associated with a lower level of assurance can be accepted. Despite the promising potential, system-level radiation testing can be applied to the functional verification of systems under restricted intrinsic boundaries. Most of them are related to the use of hadrons as opposed to heavy ions. Hadrons are preferred for the irradiation of any bulky system, in general, because of their deeper penetration capabilities. General guidelines about the test preparation and procedure for a high-level radiation test are provided to allow understanding which information can be extracted from these kinds of functional verification schemes in order to compare them with the reliability and availability requirements. The use of a general scaling factor for the observed high-level cross sections allows converting test cross sections into orbit rates.
DOI: 10.15480/882.3640
ISSN: 1558-1578
Institute: Hochfrequenztechnik E-3 
Document Type: Article
License: CC BY 4.0 (Attribution) CC BY 4.0 (Attribution)
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