Please use this identifier to cite or link to this item: https://doi.org/10.15480/882.2054
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dc.contributor.authorFurlan, Kaline P.-
dc.contributor.authorLarsson, Emanuel-
dc.contributor.authorDiaz, Ana-
dc.contributor.authorHoller, Mirko-
dc.contributor.authorKrekeler, Tobias-
dc.contributor.authorRitter, Martin-
dc.contributor.authorPetrov, Alexander Yu.-
dc.contributor.authorEich, Manfred-
dc.contributor.authorBlick, Robert-
dc.contributor.authorSchneider, Gerold A.-
dc.contributor.authorGreving, Imke-
dc.contributor.authorZierold, Robert-
dc.contributor.authorJanßen, Rolf-
dc.date.accessioned2019-02-26T06:17:18Z-
dc.date.available2019-02-26T06:17:18Z-
dc.date.issued2018-10-27-
dc.identifier.citationData in brief (21): 1924-1936 (2018-12)de_DE
dc.identifier.issn2352-3409de_DE
dc.identifier.urihttp://hdl.handle.net/11420/2058-
dc.description.abstractThis data article describes the detailed parameters for synthesizing mullite inverse opal photonic crystals via Atomic Layer Deposition (ALD), as well as the detailed image analysis routine used to interpret the data obtained by the measurement of such photonic crystals, before and after the heat treatment, via Ptychographic X-ray Computed Tomography (PXCT). The data presented in this article are related to the research article by Furlan and co-authors entitled "Photonic materials for high-temperature applications: Synthesis and characterization by X-ray ptychographic tomography" (Furlan et al., 2018). The data include detailed information about the ALD super-cycle process to generate the ternary oxides inside a photonic crystal template, the raw data from supporting characterization techniques, as well as the full dataset obtained from PXCT. All the data herein described is publicly available in a Mendeley Data archive "Dataset of synthesis and characterization by PXCT of ALD-based mullite inverse opal photonic crystals" located at https://data.mendeley.com/datasets/zn49dsk7x6/1 for any academic, educational, or research purposes.en
dc.language.isoende_DE
dc.publisherElsevierde_DE
dc.relation.ispartofData in Briefde_DE
dc.rightsinfo:eu-repo/semantics/openAccessde_DE
dc.subject.ddc620: Ingenieurwissenschaftende_DE
dc.titleDataset of ptychographic X-ray computed tomography of inverse opal photonic crystals produced by atomic layer depositionde_DE
dc.typeArticlede_DE
dc.identifier.urnurn:nbn:de:gbv:830-882.027195-
dc.identifier.doi10.15480/882.2054-
dc.type.diniarticle-
dc.subject.ddccode620-
dcterms.DCMITypeText-
tuhh.identifier.urnurn:nbn:de:gbv:830-882.027195-
tuhh.oai.showtruede_DE
tuhh.abstract.englishThis data article describes the detailed parameters for synthesizing mullite inverse opal photonic crystals via Atomic Layer Deposition (ALD), as well as the detailed image analysis routine used to interpret the data obtained by the measurement of such photonic crystals, before and after the heat treatment, via Ptychographic X-ray Computed Tomography (PXCT). The data presented in this article are related to the research article by Furlan and co-authors entitled "Photonic materials for high-temperature applications: Synthesis and characterization by X-ray ptychographic tomography" (Furlan et al., 2018). The data include detailed information about the ALD super-cycle process to generate the ternary oxides inside a photonic crystal template, the raw data from supporting characterization techniques, as well as the full dataset obtained from PXCT. All the data herein described is publicly available in a Mendeley Data archive "Dataset of synthesis and characterization by PXCT of ALD-based mullite inverse opal photonic crystals" located at https://data.mendeley.com/datasets/zn49dsk7x6/1 for any academic, educational, or research purposes.de_DE
tuhh.publisher.doi10.1016/j.dib.2018.10.076-
tuhh.publication.instituteKeramische Hochleistungswerkstoffe M-9de_DE
tuhh.publication.instituteBetriebseinheit Elektronenmikroskopie M-26de_DE
tuhh.publication.instituteOptische und Elektronische Materialien E-12de_DE
tuhh.identifier.doi10.15480/882.2054-
tuhh.type.opus(wissenschaftlicher) Artikel-
tuhh.institute.germanOptische und Elektronische Materialien E-12de
tuhh.institute.englishOptische und Elektronische Materialien E-12de_DE
tuhh.gvk.hasppnfalse-
openaire.rightsinfo:eu-repo/semantics/openAccessde_DE
dc.type.driverarticle-
dc.rights.ccversion4.0de_DE
dc.type.casraiJournal Article-
tuhh.container.volume21de_DE
tuhh.container.startpage1924de_DE
tuhh.container.endpage1936de_DE
dc.relation.projectSFB 986: Teilprojekt C2 - Keramikbasierte hochtemperaturstabile Wärmestrahlungsreflektoren und Strukturfarbende_DE
dc.relation.projectSFB 986: Teilprojekt C5 - Oxidische Hochtemperatur-Schutzschichtsysteme mittels angepasster Porenstrukturde_DE
dc.relation.projectSFB 986: Zentralprojekt Z3 - Elektronenmikroskopie an multiskaligen Materialsystemen-
dc.rights.nationallicensefalsede_DE
datacite.relation.IsSupplementedBydoi:10.17632/zn49dsk7x6.1de_DE
item.fulltextWith Fulltext-
item.creatorGNDFurlan, Kaline P.-
item.creatorGNDLarsson, Emanuel-
item.creatorGNDDiaz, Ana-
item.creatorGNDHoller, Mirko-
item.creatorGNDKrekeler, Tobias-
item.creatorGNDRitter, Martin-
item.creatorGNDPetrov, Alexander Yu.-
item.creatorGNDEich, Manfred-
item.creatorGNDBlick, Robert-
item.creatorGNDSchneider, Gerold A.-
item.creatorGNDGreving, Imke-
item.creatorGNDZierold, Robert-
item.creatorGNDJanßen, Rolf-
item.languageiso639-1en-
item.openairetypeArticle-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.creatorOrcidFurlan, Kaline P.-
item.creatorOrcidLarsson, Emanuel-
item.creatorOrcidDiaz, Ana-
item.creatorOrcidHoller, Mirko-
item.creatorOrcidKrekeler, Tobias-
item.creatorOrcidRitter, Martin-
item.creatorOrcidPetrov, Alexander Yu.-
item.creatorOrcidEich, Manfred-
item.creatorOrcidBlick, Robert-
item.creatorOrcidSchneider, Gerold A.-
item.creatorOrcidGreving, Imke-
item.creatorOrcidZierold, Robert-
item.creatorOrcidJanßen, Rolf-
item.cerifentitytypePublications-
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crisitem.author.deptKeramische Hochleistungswerkstoffe M-9-
crisitem.author.deptBetriebseinheit Elektronenmikroskopie M-26-
crisitem.author.deptBetriebseinheit Elektronenmikroskopie M-26-
crisitem.author.deptOptische und Elektronische Materialien E-12-
crisitem.author.deptOptische und Elektronische Materialien E-12-
crisitem.author.deptKeramische Hochleistungswerkstoffe M-9-
crisitem.author.deptKeramische Hochleistungswerkstoffe M-9-
crisitem.author.orcid0000-0003-4032-2795-
crisitem.author.orcid0000-0002-3586-5763-
crisitem.author.orcid0000-0001-8141-0148-
crisitem.author.orcid0000-0002-5664-859X-
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crisitem.author.orcid0000-0003-0292-0970-
crisitem.author.orcid0000-0001-7054-0510-
crisitem.author.parentorgStudiendekanat Maschinenbau-
crisitem.author.parentorgStudiendekanat Maschinenbau-
crisitem.author.parentorgStudiendekanat Maschinenbau-
crisitem.author.parentorgStudiendekanat Elektrotechnik, Informatik und Mathematik-
crisitem.author.parentorgStudiendekanat Elektrotechnik, Informatik und Mathematik-
crisitem.author.parentorgStudiendekanat Maschinenbau-
crisitem.author.parentorgStudiendekanat Maschinenbau-
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