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    Item type:Publication, Access status: without files ,
    Prediction of soft error rate of 4 Mbit DRAM
    (IEEE, 1987)
    Krautschneider, Wolfgang
    ;
    Meyberg, W.
    A method has been developed for estimation of soft error rate of memory chips. At special test structures which are as simply designed as possibly the charge collection induced by alpha strikes is measured. From these data the soft error rate can be calculated.
    Publicationtype: Conference Paper
      19