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Item type:Publication, Access status: without files , Identification of critical frequencies in wideband near-field spatial scans(IEEE, 2026-03-31); ; ; ; Identifying critical frequencies of a device under test (DUT) from its near-field scans is an essential step in integrating near-field scanning into electromagnetic compatibility (EMC) testing. Indeed, real electronic devices may exhibit radiated emissions at multiple frequencies, which are unknown a priori. To this end, three computational methods are introduced to identify the frequencies at which the DUT is radiating: the space-filled spectrogram analysis, the grey level co-occurrence matrix approach, and spatial fast Fourier transform approach. Although a single general solution is not provided, each method leverages different properties of the measurements to extract significant features and identify frequencies of interest. Therefore, the choice of which method to apply depends on the characteristics of the DUT and on the requirements of the specific measurement campaign. The proposed methods are evaluated on a common dataset, assessing their computational efficiency, sensitivity to patterns, and robustness against noise. Case studies demonstrate their successful application in real-world scenarios and their comparative analysis provides insights into selecting the most appropriate approach for a specific application.Publicationtype: Journal Article9 - Some of the metrics are blocked by yourconsent settings
Item type:Publication, Access status: without files , Morphological Search for Near-Field Equivalent Infinitesimal Dipole ModelsNear-field modeling techniques have proven to be very useful for electromagnetic compatibility evaluation. In this article, a new method for building infinitesimal dipolemodels using near-field phaseless scans is presented. The proposed approach enables the identification of optimal dipole source locations by comparing the pattern of an infinitesimal dipole with the measured field maps. Finally, the dipole moments are fitted by using the Levenberg–Marquardt algorithm. This method is validated on two different virtual devices and on measurements from a real device. These test cases cover a range of frequencies (156, 381, 514, and 1 GHz) and scan dimensions (9.4 cm × 8.4 cm and 10.6 cm × 14 cm), demonstrating the robustness and versatility of the proposed method.Publicationtype: Journal Article26 - Some of the metrics are blocked by yourconsent settings
Item type:Publication, Access status: without files , Partial image expansion applied to real near-field measurement data modelingThis work uses the partial image expansion method to build an infinitesimal dipole model (IDM) of a physical Printed Circuit Board (PCB) starting from the measured near-fields. Using partial image expansion allows to include the substrate directly in the equivalent model, that is composed of PEC plane, substrate and dipole sources. The addition of the dielectric increases the model versatility allowing for a wider range of simulations to be run (e.g. closed environments, multiple boards, etc.). In this paper, the radiation model of the physical device is obtained and imported in a commercial full-wave solver (HFSS). The simulation results are finally compared with the original measurements, experimentally validating the accuracy of an IDM built using partial image expansion.Publicationtype: Conference Paper20