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Item type:Publication, Access status: without files , Auto-generating ageing self-tests with hardware in the loop for commercial microcontrollersMicrocontrollers in critical systems require monitoring of hardware ageing to avoid unexpected malfunctioning. We previously introduced a deployable timing-based method with self-tests for ageing monitoring in commercial microcontrollers that relies solely on user-level information. While effective, manually constructing computing payloads for system-level tests can limit scaling and coverage of hardware-specific critical paths or subsystems. In this paper, we complement our technique with an automated generation of the self-test firmware. We explore several approaches for generation using hardware in the loop (HiL) evaluation on commercial microcontrollers, including a random generation and evolutionary strategies. In the evolutionary approach, we investigate two mutation mechanisms: random selection, and contextual bandits. Our evaluations on real hardware and a surrogate model show the impact of evaluation budget and algorithm selection on the effectiveness of automatic self-test generation. Results reveal that random generation is well suited to reduced HiL explorations, while evolutionary strategies benefit from extended evaluations. Our Hil-based technique is able to produce firmwares with up to double the degradation sensitivity as the functional tests provided by the vendor.Publicationtype: Conference Paper16