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    Item type:Publication, Access status: without files ,
    On the use of multilayer Laue lenses with X-ray free electron lasers
    (SPIE, 2021)
    Prasciolu, Mauro
    ;
    Murray, Kevin T.
    ;
    Ivanov, Nikolay
    ;
    Fleckenstein, Holger
    ;
    Domaracky, Martin
    We report on the use of multilayer Laue lenses to focus the intense X-ray Free Electron Laser (XFEL) beam at the European XFEL to a spot size of a few tens of nanometers. We present the procedure to align and characterize these lenses and discuss challenges working with the pulse trains from this unique X-ray source.
    Publicationtype: Conference Paper
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