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Item type:Publication, Access status: without files , Hard x-ray stereo ptychography with multislicing(SPIE, 2025-09-19); ; ; ; Our newly developed technique of stereoscopic ptychography allows us to scan the sample simultaneously with two nanofocused x-ray beams at different angles. The stereoscopic views can, similar to human vision, considerably improve the in-depth perception beyond current limits of pure 2D imaging systems using single optics. We achieved a sub-30nm lateral resolution and are able to recover phase images of two sample layers, which are separated by less than 500nm, based on stereo projections. With stereo ptychography we improved the depth resolution by one order of magnitude compared to the established multi-slice ptychography. Here, we take these capabilities a step further by applying them to thicker samples. This is done by combining layer recovery through stereo imaging with multislice ptychography.Publicationtype: Conference Paper16 - Some of the metrics are blocked by yourconsent settings
Item type:Publication, Access status: with files , Stereo hard X-ray ptychography(Optica Publishing Group, 2025-05-23); ; ; ; Hard X-ray ptychography has strongly developed during the last decade, enabling one to visualize structural properties of materials at high spatial resolution. By combining it with multi-slicing or tomographic techniques, optically thick samples can be investigated in 3D. Nevertheless, the depth resolution in multi-slicing is often limited to several micrometers by the ptychographic optical system and a full laminographic or tomographic investigation may be hindered by experimental constraints of limited space or acquisition time. Here, we introduce a stereoscopic imaging system using two inclined nanofocused X-ray beams to illuminate a sample at varying angles at the same time. Similar to human vision, adding these stereoscopic views results in considerably improved in-depth resolution beyond the current limits of pure 2D imaging systems. This is especially promising for experimental applications requiring bulky sample environments.Publicationtype: Journal Article28 37